• DocumentCode
    2072988
  • Title

    Propagation of spin-polarized electrons through interfaces separating differently doped semiconductor regions

  • Author

    Pershin, Yuriy V. ; Privman, Vladimir

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    14-14 Aug. 2003
  • Firstpage
    168
  • Lastpage
    170
  • Abstract
    High degree of electron spin polarization is of crucial importance in operation of spintronic devices. We study the propagation of spin-polarized electrons through a boundary between two n-type semiconductor regions with different doping levels. We assume that inhomogeneous spin polarization is created/injected locally and driven through the boundary by the electric field. The electric field distribution and spin polarization distribution are calculated within a two-component drift-diffusion transport model. We show that an initially created narrow region of spin polarization can be further compressed and amplified near the boundary. Since the boundary involves variation of doping but no real interface between two semiconductor materials, no significant spin-polarization loss is expected. The proposed mechanism will be therefore useful in designing new spintronic devices.
  • Keywords
    electron spin polarisation; magnetoelectronics; semiconductor junctions; semiconductor materials; doped semiconductor regions; doping levels; drift diffusion transport model; electric field; electric field distribution; inhomogeneous spin polarization; n type semiconductor regions; semiconductor materials; spin boundary; spin polarization distribution; spin polarization loss; spin polarized electrons; spintronic devices; Electron mobility; Magnetoelectronics; Nonuniform electric fields; Physics; Polarization; Quantum computing; Semiconductor device doping; Semiconductor devices; Semiconductor materials; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1231742
  • Filename
    1231742