Title :
Implementation of a loss-free programmable AC load
Author :
Vázquez, R. ; Olías, E. ; Lázaro, A. ; Barrado, A. ; Pleite, J.
Author_Institution :
Univ. Carlos III de Madrid, Spain
fDate :
31 Aug-4 Sep 1998
Abstract :
The burn-in and operation tests of power converters, UPSs and other kinds of power supplies are carried out using resistors combined with reactive elements as load, which have losses of energy. Several solutions have been proposed using switching power converters as DC load, with the purpose of saving energy during these reliability tests. The implementation of a loss-free programmable AC load is presented, which can be programmed with arbitrary current waveforms and work in the four quadrants of the I-V characteristic. The topology of switching current inverter, implemented with IGBTs as switching devices, was used. This kind of solution can be used as an emulator of the actual loads during the burn-in test and operation tests of the circuits with voltage source behaviour. The energy demanded from the circuit under test can be recycled to the utility
Keywords :
DC-AC power convertors; insulated gate bipolar transistors; invertors; load (electric); power bipolar transistors; power semiconductor switches; switching circuits; I-V characteristic; IGBT switching devices; UPS; arbitrary current waveforms; four quadrant operation; loss-free programmable AC load; power supplies; reliability tests; switching power converters; voltage source behaviour; Central Processing Unit; Circuit testing; Circuit topology; Consumer electronics; Data acquisition; Electronic equipment testing; Insulated gate bipolar transistors; Power supplies; Resistors; Voltage;
Conference_Titel :
Industrial Electronics Society, 1998. IECON '98. Proceedings of the 24th Annual Conference of the IEEE
Conference_Location :
Aachen
Print_ISBN :
0-7803-4503-7
DOI :
10.1109/IECON.1998.724166