DocumentCode
2073011
Title
A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS
Author
Xin Zhang ; Po-Hung Chen ; Ryu, Yoshikatsu ; Ishida, K. ; Okuma, Yasuyuki ; Watanabe, K. ; Sakurai, Takayasu ; Takamiya, Makoto
Author_Institution
Univ. of Tokyo, Tokyo, Japan
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
109
Lastpage
110
Abstract
A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.
Keywords
CMOS integrated circuits; DC-DC power convertors; PWM power convertors; CMOS process; clock frequency scaled digital PWM controller; delay line; die to die delay variations; linear delay trimming; logarithmic stress voltage; low voltage buck DC-DC converter; on-chip gate boost technique; Clocks; DC-DC power converters; Delay lines; Delays; Logic gates; Pulse width modulation; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509580
Filename
6509580
Link To Document