• DocumentCode
    2073011
  • Title

    A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS

  • Author

    Xin Zhang ; Po-Hung Chen ; Ryu, Yoshikatsu ; Ishida, K. ; Okuma, Yasuyuki ; Watanabe, K. ; Sakurai, Takayasu ; Takamiya, Makoto

  • Author_Institution
    Univ. of Tokyo, Tokyo, Japan
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    109
  • Lastpage
    110
  • Abstract
    A low voltage buck DC-DC converter (0.45-V input, 0.4-V output) with on-chip gate boosted (OGB) and clock frequency scaled digital PWM controller is designed in 40-nm CMOS process. The highest efficiency to date is achieved at the output power less than 40μW. In order to compensate for the die-to-die delay variations of a delay line in the proposed digital PWM controller, a linear delay trimming by a logarithmic stress voltage (LSV) scheme with good controllability is also proposed and verified in measurement.
  • Keywords
    CMOS integrated circuits; DC-DC power convertors; PWM power convertors; CMOS process; clock frequency scaled digital PWM controller; delay line; die to die delay variations; linear delay trimming; logarithmic stress voltage; low voltage buck DC-DC converter; on-chip gate boost technique; Clocks; DC-DC power converters; Delay lines; Delays; Logic gates; Pulse width modulation; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509580
  • Filename
    6509580