DocumentCode
2073072
Title
Dependable VLSI Platform using Robust Fabrics
Author
Onodera, Hidetoshi
Author_Institution
Dept. Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
119
Lastpage
124
Abstract
Technology scaling and growing complexity have an increasing impact on the resilience of VLSI circuits and systems. Severe challenges have been emerging for the realization of dependable VLSI circuits and systems with necessary and sufficient amount of reliability and security. For coping with the increasing threats on manufacturability, variability, and transient (soft) errors, we have been working on the development of “Dependable VLSI Platform using Robust Fabrics.” The project tackles the challenges with collaborative researches on layout, circuit, architecture, and design automation. Overview of the project as well as key achievements on the component-level (Fabrics) and the architecture-level (reconfigurable architecture) will be explained, followed by a brief introduction of the platform SoC and its C-based design tools.
Keywords
VLSI; electronic design automation; integrated circuit layout; integrated circuit reliability; radiation hardening (electronics); reconfigurable architectures; system-on-chip; C-based design tools; VLSI platform; design automation; integrated circuit layout; integrated circuit reliability; platform SoC; reconfigurable architecture; robust fabrics; soft errors; technology scaling; transient errors; Arrays; Clocks; Resilience; Robustness; Tunneling magnetoresistance; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509583
Filename
6509583
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