• DocumentCode
    2073072
  • Title

    Dependable VLSI Platform using Robust Fabrics

  • Author

    Onodera, Hidetoshi

  • Author_Institution
    Dept. Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    119
  • Lastpage
    124
  • Abstract
    Technology scaling and growing complexity have an increasing impact on the resilience of VLSI circuits and systems. Severe challenges have been emerging for the realization of dependable VLSI circuits and systems with necessary and sufficient amount of reliability and security. For coping with the increasing threats on manufacturability, variability, and transient (soft) errors, we have been working on the development of “Dependable VLSI Platform using Robust Fabrics.” The project tackles the challenges with collaborative researches on layout, circuit, architecture, and design automation. Overview of the project as well as key achievements on the component-level (Fabrics) and the architecture-level (reconfigurable architecture) will be explained, followed by a brief introduction of the platform SoC and its C-based design tools.
  • Keywords
    VLSI; electronic design automation; integrated circuit layout; integrated circuit reliability; radiation hardening (electronics); reconfigurable architectures; system-on-chip; C-based design tools; VLSI platform; design automation; integrated circuit layout; integrated circuit reliability; platform SoC; reconfigurable architecture; robust fabrics; soft errors; technology scaling; transient errors; Arrays; Clocks; Resilience; Robustness; Tunneling magnetoresistance; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509583
  • Filename
    6509583