DocumentCode :
2073470
Title :
Statistical analysis of lightning transients in grounding grids
Author :
Amiri, E. ; Sheshyekani, K. ; Shoory, A. ; Sadeghi, S.H.H. ; Moini, R.
Author_Institution :
Electr. Eng. Dept., Amirkabir Univ. of Technol., Tehran
fYear :
2008
fDate :
19-23 May 2008
Firstpage :
778
Lastpage :
781
Abstract :
An statistical description of safety aspects of grounding grids is presented in this paper. The methodology is based on the Monte Carlo simulation of the grounding grid response to the probabilistic distribution of the injected current. Frequency domain method of moments (MoM) solution of the governing electric field integral equation (EFIE) is used to simulate the grounding grid performance. The mapping of frequency domain data to the corresponding data and vice versa are achieved through using the fast Fourier transform (FFT) and inverse FFT (IFFT) techniques. The proposed simulation methodology is used to obtain the probability by which the safety limits of a given grounding grid are violated. For the current simulation we considered the maximum value of ground surface electric field and scalar potential or namely the ground potential rise (GPR) as representatives of safety indices.
Keywords :
Monte Carlo methods; earthing; fast Fourier transforms; lightning protection; method of moments; power grids; statistical distributions; MoM; Monte Carlo simulation; fast Fourier transform; frequency domain method of moments; governing electric field integral equation; ground potential rise; grounding grids; injected current; inverse FFT; lightning transients; probabilistic distribution; statistical analysis; Fast Fourier transforms; Frequency domain analysis; Ground penetrating radar; Grounding; Integral equations; Lightning; Moment methods; Safety; Statistical analysis; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
Type :
conf
DOI :
10.1109/APEMC.2008.4559991
Filename :
4559991
Link To Document :
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