Title :
Electromagnetic topology analysis on relation between electromagnetic interference inside equipment and external electrostatic discharge
Author :
Niu, Bo ; Song, Zhengxiang ; Geng, Yingsan ; Wang, Jianhua ; Wang, Jing
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an
Abstract :
Simulation based on electromagnetic topology theory was applied to analyze the relationship between internal electromagnetic interference (EMI) and external electrostatic discharge (ESD) of semi-shielded electrical equipment. The topological structure model of the equipment was built to analyze the coupling paths of external disturbance. To the aperture coupling path, a new method was adopted to determine the transfer function between external disturbance and internal sensitive component, which was modeled as a wire conductor in this paper. The simulation result shows that the EMI induced by external ESD on the wire conductor depends on its length and location. The results compare well with previous reports.
Keywords :
electromagnetic interference; electromagnetic shielding; electrostatic discharge; EMI; ESD; aperture coupling path; electromagnetic interference; electromagnetic topology analysis; external disturbance coupling paths; external electrostatic discharge; internal sensitive component; semi-shielded electrical equipment; transfer function; Analytical models; Apertures; Conductors; Electromagnetic analysis; Electromagnetic interference; Electrostatic analysis; Electrostatic discharge; Electrostatic interference; Topology; Wire;
Conference_Titel :
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-981-08-0629-3
Electronic_ISBN :
978-981-08-0629-3
DOI :
10.1109/APEMC.2008.4560000