DocumentCode
2073668
Title
TRL Calibration Applied to the Measurement of Chip Transistor S-Parameters Up to 40 GHz
Author
Pradell, L. ; Sabater, C. ; Artal, E. ; Comerón, A. ; Bará, J. ; Corbella, I. ; Fortuny, J.
Volume
1
fYear
1990
fDate
9-13 Sept. 1990
Firstpage
214
Lastpage
219
Abstract
The design of a Microstrip Test Fixture for TRL calibration, based on mobile, precisely positioned coax-to-microstrip transitions, is described. Experimental results for the measurement of GaAs FET and HEMT chips S-parameters in the 1-40 GHz frequency band are presented, and compared with the manufacturer\´s available data. Theoretical considerations and experimental results for the repeatability of transitions, based on a useful "error box" model, are also presented.
Keywords
Calibration; Coaxial components; FETs; Fixtures; Frequency measurement; Gallium arsenide; Microstrip; Scattering parameters; Semiconductor device measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1990. 20th European
Conference_Location
Budapest, Hungary
Type
conf
DOI
10.1109/EUMA.1990.336046
Filename
4136003
Link To Document