DocumentCode
2073672
Title
A tiny plastic package of pressure sensors fabricated using the lithographic dam-ring approach
Author
Lung-Tai Chen ; Hsu, Chung-Yi ; Chang, Jin-Sgeng ; Chu, Chun-Hsun ; Cheng, Woo-Hi ; Xie, Yue-Zhe ; Chen, R.S.
Author_Institution
Micro-Syst. Technol. Center, ITRI
fYear
2009
fDate
26-29 May 2009
Firstpage
1676
Lastpage
1681
Abstract
This study presents a novel plastic package for piezoresistive pressure sensors. A photoresist dam-ring patterned using the lithographic process is spin-coated on a piezoresistive pressure sensor to define a sensing channel in the pressure sensor package. Fluid epoxy molding encapsulates the pressure sensor and exposes the sensing channel during a high-temperature molding process at 165degC. Experimental observations reveal that the silicon membrane of the pressure sensor is completely free of epoxy molding compound (EMC) contamination after the transfer molding process. The effectiveness of the dam-ring in shielding the silicon membrane of the pressure sensor during the molding process was confirmed. The packaged pressure sensor exerts a thermo-mechanical stress on the silicon membrane of the pressure sensor, resulting in an undesired output voltage drift. However, employing a package design with a large sensing channel opening can reduce the effect of package-induced stress. The proposed packaging scheme was a small package volume and surface-mount device (SMD) compatible features, making it suitable for portable commercial devices.
Keywords
membranes; photoresists; piezoresistive devices; plastic packaging; pressure sensors; silicon; spin coating; surface mount technology; transfer moulding; Si; epoxy molding compound; fluid epoxy molding encapsulation; lithographic process; patterned photoresist dam-ring; piezoresistive pressure sensors; plastic package; pressure sensor package; silicon membrane; spin-coating; surface-mount device; temperature 165 degC; thermo-mechanical stress; transfer molding process; Biomembranes; Contamination; Electromagnetic compatibility; Piezoresistance; Plastic packaging; Resists; Silicon; Thermal sensors; Thermal stresses; Transfer molding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
Conference_Location
San Diego, CA
ISSN
0569-5503
Print_ISBN
978-1-4244-4475-5
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2009.5074240
Filename
5074240
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