• DocumentCode
    2073672
  • Title

    A tiny plastic package of pressure sensors fabricated using the lithographic dam-ring approach

  • Author

    Lung-Tai Chen ; Hsu, Chung-Yi ; Chang, Jin-Sgeng ; Chu, Chun-Hsun ; Cheng, Woo-Hi ; Xie, Yue-Zhe ; Chen, R.S.

  • Author_Institution
    Micro-Syst. Technol. Center, ITRI
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    1676
  • Lastpage
    1681
  • Abstract
    This study presents a novel plastic package for piezoresistive pressure sensors. A photoresist dam-ring patterned using the lithographic process is spin-coated on a piezoresistive pressure sensor to define a sensing channel in the pressure sensor package. Fluid epoxy molding encapsulates the pressure sensor and exposes the sensing channel during a high-temperature molding process at 165degC. Experimental observations reveal that the silicon membrane of the pressure sensor is completely free of epoxy molding compound (EMC) contamination after the transfer molding process. The effectiveness of the dam-ring in shielding the silicon membrane of the pressure sensor during the molding process was confirmed. The packaged pressure sensor exerts a thermo-mechanical stress on the silicon membrane of the pressure sensor, resulting in an undesired output voltage drift. However, employing a package design with a large sensing channel opening can reduce the effect of package-induced stress. The proposed packaging scheme was a small package volume and surface-mount device (SMD) compatible features, making it suitable for portable commercial devices.
  • Keywords
    membranes; photoresists; piezoresistive devices; plastic packaging; pressure sensors; silicon; spin coating; surface mount technology; transfer moulding; Si; epoxy molding compound; fluid epoxy molding encapsulation; lithographic process; patterned photoresist dam-ring; piezoresistive pressure sensors; plastic package; pressure sensor package; silicon membrane; spin-coating; surface-mount device; temperature 165 degC; thermo-mechanical stress; transfer molding process; Biomembranes; Contamination; Electromagnetic compatibility; Piezoresistance; Plastic packaging; Resists; Silicon; Thermal sensors; Thermal stresses; Transfer molding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074240
  • Filename
    5074240