Title : 
EM field coupling to microstrip lines using Rigorously Coupled Multi-conductor Strips
         
        
            Author : 
Khodabakhshi, Hamid ; Cheldavi, Ahamd
         
        
            Author_Institution : 
Iran Univ. of Sci. & Technol., Tehran
         
        
        
        
        
        
            Abstract : 
A model for two-dimensional analysis of microstrip lines, called rigorously coupled multi-conductor strip (RCMS) is introduced. In this model, the width of the strip of a microstrip line is subdivided into a large number of rigorously coupled narrow strips. So, a microstrip line can be considered as a coupled multi-conductor transmission line. Determination of the capacitance and inductance matrices of the model is introduced, also. The voltages and currents induced by electromagnetic fields for this coupled multi-condutor strips problem can be obtained using Bernardipsilas method. Finally, the validity and efficiency of the introduced method is investigated using previous work.
         
        
            Keywords : 
capacitance; coupled transmission lines; electromagnetic coupling; inductance; matrix algebra; microstrip lines; microwave circuits; millimetre wave circuits; multiconductor transmission lines; Bernardi method; EM field coupling; RCMS; capacitance matrix; inductance matrix; microstrip lines; microwave circuits; millimeter wave circuits; multiconductor transmission line; rigorously coupled multiconductor strip; two-dimensional analysis; Capacitance; Coupled mode analysis; Couplings; Electromagnetic fields; Inductance; Microstrip; Multiconductor transmission lines; Strips; Transmission line matrix methods; Voltage;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility, 2008. APEMC 2008. Asia-Pacific Symposium on
         
        
            Conference_Location : 
Singapore
         
        
            Print_ISBN : 
978-981-08-0629-3
         
        
            Electronic_ISBN : 
978-981-08-0629-3
         
        
        
            DOI : 
10.1109/APEMC.2008.4560011