• DocumentCode
    2074015
  • Title

    A case study of functional design using functional simulation and logic synthesis

  • Author

    Takei, Tsutomu ; Sekine, Masatoshi ; Nishi, Hiroaki ; Kitahara, Takeshi ; Masuda, Atsushi

  • Author_Institution
    Toshiba Corp., Kawasaki, Japan
  • fYear
    1989
  • fDate
    25-28 Sep 1989
  • Lastpage
    37987
  • Abstract
    Design time reduction to a half of what was previously required was achieved by a register-transfer-level (RTL) design procedure. The problems encountered in rule-based synthesis were identified through a detailed comparison of the manual logic design procedure with the rule-based logic synthesis procedure. A logic synthesizer using a rule base for local transformations was developed that is able to generate practical logic circuits, even if the RTL descriptions for the circuits are large. The synthesized logic circuits are influenced by the form of the RTL descriptions. The logic synthesizer must generate the good logic circuits, using the meaning of the macro function. The logic synthesizer, using the local optimization, cannot remove the redundancy of the deep if-clause-nesting without the circuit semantics. If there are rules that clear the gates to allow the signal to move forward, more satisfactory optimization will be realized
  • Keywords
    VLSI; integrated logic circuits; logic CAD; RTL; case study; circuit semantics; deep if-clause-nesting; design procedure; design time reduction; functional design; functional simulation; gate count reduction; local optimization; local transformations; logic synthesis; logic synthesizer; macro function; manual logic design procedure; redundancy; register-transfer-level; rule-based synthesis; Automatic control; Automatic logic units; Computer aided software engineering; Control system synthesis; Graphics; Libraries; Logic design; Synthesizers; Ultra large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Seminar and Exhibit, 1989. Proceedings., Second Annual IEEE
  • Conference_Location
    Rochester, NY
  • Type

    conf

  • DOI
    10.1109/ASIC.1989.123178
  • Filename
    123178