Title : 
Pulsed-latch ASIC synthesis in industrial design flow
         
        
            Author : 
Sangmin Kim ; Duckhwan Kim ; Youngsoo Shin
         
        
            Author_Institution : 
Dept. of Electr. Eng., KAIST, Daejeon, South Korea
         
        
        
        
        
        
            Abstract : 
Flip-flop has long been used as a sequencing element of choice in ASIC design; commercial synthesis tools have also been developed in this context. This work has been motivated by a question of whether existing CAD tools can be employed from RTL to layout while pulsed latch replaces flip-flop as a sequencing element. Two important problems have been identified and their solutions are proposed: placement of pulse generators and latches for integrity of pulse shape, and design of special scan latches and their selective use to reduce hold violations. A reference design flow has also been set up using published documents, in order to assess the proposed one. In 40-nm technology, the proposed flow achieves 20% reduction in circuit area and 30% reduction in power consumption, on average of 12 test circuits.
         
        
            Keywords : 
application specific integrated circuits; flip-flops; integrated circuit layout; pulse generators; CAD tools; RTL; flip-flop; industrial design flow; integrated circuit layout; pulse generator placement; pulse shape integrity; pulsed latch ASIC synthesis; reduce hold violation; scan latch; sequencing element; size 40 nm; Application specific integrated circuits; Clocks; Delays; Generators; Latches; Pulse generation; Standards;
         
        
        
        
            Conference_Titel : 
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
         
        
            Conference_Location : 
Yokohama
         
        
        
            Print_ISBN : 
978-1-4673-3029-9
         
        
        
            DOI : 
10.1109/ASPDAC.2013.6509621