DocumentCode
2074327
Title
Three-port interferometer in silicon-on-insulator for wavelength monitoring and displacement measurement
Author
Harmsma, Peter ; Staats, John-Paul ; Cascio, Dario Lo ; Cheng, Lun
Author_Institution
TNO, Delft, Netherlands
fYear
2011
fDate
22-26 May 2011
Firstpage
1
Lastpage
1
Abstract
We report on the first 3-port interferometer fabricated in Silicon-On-Insulator (SOI) waveguide technology. The integrated device has the benefits of intrinsic mechanical stability, small size, a form factor suitable for accurate temperature control, and accurate definition of optical path length difference.
Keywords
displacement measurement; light interferometers; silicon-on-insulator; displacement measurement; optical path length difference; silicon-on-insulator; three-port interferometer; wavelength monitoring; Fiber gratings; Optical fibers; Optical interferometry; Optical reflection; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe (CLEO EUROPE/EQEC), 2011 Conference on and 12th European Quantum Electronics Conference
Conference_Location
Munich
ISSN
Pending
Print_ISBN
978-1-4577-0533-5
Electronic_ISBN
Pending
Type
conf
DOI
10.1109/CLEOE.2011.5943282
Filename
5943282
Link To Document