• DocumentCode
    2074366
  • Title

    Design issues in heterogeneous 3D/2.5D integration

  • Author

    Milojevic, Dragomir ; Marchal, P. ; Marinissen, Erik Jan ; Van der Plas, G. ; Verkest, D. ; Beyne, Eric

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    403
  • Lastpage
    410
  • Abstract
    Efficient processing of fine-pitched Through Silicon Vias, micro-bumps and back-side re-distribution layers enable face-to-back or face-to-face integration of heterogeneous ICs using 3D stacking and/or Silicon Interposers. While these technology features are extremely compelling, they considerably stress the existing design practices and EDA tool flows typically conceived for 2D systems. With all system, technology and implementation level options brought with these features, the design space increases to an extent where traditional 2D tools cannot be used any more for efficient exploration. Therefore, the cost-effective design of future 3D ICs products will require new planning and co-optimisation techniques and tools that are fast and accurate enough to cope with these challenges. In this paper we present design methodology and the practical EDA tool chain that covers different aspects of the design flow and is specific to efficient design of 3D-ICs. Flow features include: fast synthesis and 3D design partitioning at gate level, TSV/micro-bump array planning, 3D floor planning, placement and routing, congestion analysis, fast thermal and mechanical modeling, easy technology vs. implementation trade-off analysis, 3D device models generations and Design-for-Test (DfT). The application of the tool chain is illustrated using concrete example of a real-world design, showing not only the applicability of the tool chain, but also the benefits of heterogeneous 2.5 and 3D integration technologies.
  • Keywords
    design for testability; fine-pitch technology; integrated circuit layout; integrated circuit modelling; network routing; silicon; three-dimensional integrated circuits; 2D systems; 3D design partitioning; 3D device models generations; 3D floor planning; 3D stacking; DfT; EDA tool chain; TSV array planning; back-side redistribution layers; congestion analysis; cooptimisation techniques; cost-effective design; design flow; design issues; design methodology; design practices; design space; design-for-test; face-to-back integration; face-to-face integration; fine-pitched through silicon vias; future 3D IC products; gate level; heterogeneous 2.5 integration technology; heterogeneous 3D integration technology; heterogeneous 3D/2.5D integration; heterogeneous IC; implementation trade-off analysis; mechanical modeling; microbump array planning; microbumps; placement and routing; planning techniques; real-world design; silicon interposers; thermal modeling; Planning; Random access memory; Routing; Silicon; Standards; Three-dimensional displays; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509630
  • Filename
    6509630