• DocumentCode
    2074649
  • Title

    Numerical tools for the study of instabilities within the positive-differential-resistance regions of tunneling devices

  • Author

    Lasater, M.S. ; Zhao, P. ; Kelley, C.T. ; Woolard, D.L.

  • Author_Institution
    Dept. of Math., North Carolina State Univ., Raleigh, NC, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    12-14 Aug. 2003
  • Firstpage
    390
  • Abstract
    This paper presents theoretical results on instability processes that occur in the positive-differential-resistance region of nanoscale tunneling structures and reports on efforts to development advanced numerical techniques for use in future optimization studies. These results were obtained from numerical implementations of the Wigner-Poisson electron transport model. Here, the primary focus of the reported research is on developing simulation methods that are adaptive to parallel-computing platforms. Together, these investigations demonstrate the high computational demands associated with modeling fully time-dependent phenomenon in resonant tunneling structures (RTS) and offer new numerical solutions for the rapid and efficient analysis of these types of problems. Furthermore, the simulation tools under development will enable future investigations into new quantum phenomenon that strongly influence instability processes in RTSs.
  • Keywords
    Poisson distribution; Wigner distribution; nanostructured materials; numerical analysis; resonant tunnelling devices; semiconductor device models; Wigner Poisson electron transport model; instability processes; numerical analysis; optimization; parallel computing platforms; positive differential resistance regions; time dependent phenomenon; Circuits; Computational modeling; Frequency; Laboratories; Mathematics; Military computing; Oscillators; Power generation; Quantum well devices; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2003. IEEE-NANO 2003. 2003 Third IEEE Conference on
  • Print_ISBN
    0-7803-7976-4
  • Type

    conf

  • DOI
    10.1109/NANO.2003.1231800
  • Filename
    1231800