DocumentCode
2074943
Title
An Asymmetric Similarity Measure for Ontologies Based on the Feature Contrast Model
Author
Chua, Watson Wei Khong ; Goh, Angela Eck Soong
Author_Institution
Sch. Of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
15-18 Feb. 2010
Firstpage
1002
Lastpage
1007
Abstract
Ontology alignment is a time consuming process, especially when the two ontologies to be aligned are large. A fast and accurate ontology similarity can help the user to avoid aligning ontologies without significant similarities. In this paper, we propose an Asymmetric Similarity Measure for Ontologies (ASMO) that measures how similar the source ontology is to the target ontology. Many efficient ontology similarity measures are based on syntactic similarities between entities but these measures are unable to identify concepts represented using synonyms. We introduce a Synset Clustering method (S-Clust) to measure the synonymical similarity of concepts and our experimental results show that S-Clust is able to address the limitations of syntactic similarity measures in only 1.74% of the time taken to do a pairwise synonymical similarity comparison between concepts.
Keywords
ontologies (artificial intelligence); pattern clustering; asymmetric similarity measurement; feature contrast model; ontology alignment; pairwise synonymical similarity; source ontology; synset clustering method; target ontology; Clustering methods; Competitive intelligence; Ontologies; Software measurement; Software systems; Time measurement; Feature Contrast Model; Ontology Alignment; Ontology Similarity; Synset Clustering;
fLanguage
English
Publisher
ieee
Conference_Titel
Complex, Intelligent and Software Intensive Systems (CISIS), 2010 International Conference on
Conference_Location
Krakow
Print_ISBN
978-1-4244-5917-9
Type
conf
DOI
10.1109/CISIS.2010.47
Filename
5447382
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