DocumentCode :
2074943
Title :
An Asymmetric Similarity Measure for Ontologies Based on the Feature Contrast Model
Author :
Chua, Watson Wei Khong ; Goh, Angela Eck Soong
Author_Institution :
Sch. Of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
15-18 Feb. 2010
Firstpage :
1002
Lastpage :
1007
Abstract :
Ontology alignment is a time consuming process, especially when the two ontologies to be aligned are large. A fast and accurate ontology similarity can help the user to avoid aligning ontologies without significant similarities. In this paper, we propose an Asymmetric Similarity Measure for Ontologies (ASMO) that measures how similar the source ontology is to the target ontology. Many efficient ontology similarity measures are based on syntactic similarities between entities but these measures are unable to identify concepts represented using synonyms. We introduce a Synset Clustering method (S-Clust) to measure the synonymical similarity of concepts and our experimental results show that S-Clust is able to address the limitations of syntactic similarity measures in only 1.74% of the time taken to do a pairwise synonymical similarity comparison between concepts.
Keywords :
ontologies (artificial intelligence); pattern clustering; asymmetric similarity measurement; feature contrast model; ontology alignment; pairwise synonymical similarity; source ontology; synset clustering method; target ontology; Clustering methods; Competitive intelligence; Ontologies; Software measurement; Software systems; Time measurement; Feature Contrast Model; Ontology Alignment; Ontology Similarity; Synset Clustering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Complex, Intelligent and Software Intensive Systems (CISIS), 2010 International Conference on
Conference_Location :
Krakow
Print_ISBN :
978-1-4244-5917-9
Type :
conf
DOI :
10.1109/CISIS.2010.47
Filename :
5447382
Link To Document :
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