Title :
A Microwave System for High Accuracy High Spatial Resolution Dielectric Constant Uniformity Measurement
Author :
Bhimnathwala, H.B. ; Wang, M.S. ; Bothra, S. ; Kristal, K.W. ; Borrego, J.M.
Author_Institution :
Rensselaer Polytechnic Institute. Troy, NY 12180-3590 USA
Abstract :
This paper presents a microwave system using an aperture in a microstrip resonant probe capable of measuring dielectric constant uniformity with high accuracy and high degree of spatial resolution. The volume scanned by the probe aperture is estimated to be 0.0301" Ã 0.0101" in area and 0.010" in depth and the accuracy achieved in dielectric constant uniformity measurement at 10 Ghz is better than 0.5% by using the resonant probe as part of a frequency discriminator in the measuring system.
Keywords :
Apertures; Area measurement; Dielectric constant; Dielectric measurements; Frequency estimation; High-K gate dielectrics; Microwave measurements; Probes; Resonance; Spatial resolution;
Conference_Titel :
Microwave Conference, 1990. 20th European
Conference_Location :
Budapest, Hungary
DOI :
10.1109/EUMA.1990.336091