• DocumentCode
    2075213
  • Title

    DARNS:A randomized multi-modulo RNS architecture for double-and-add in ECC to prevent power analysis side channel attacks

  • Author

    Ambrose, Jude Angelo ; Pettenghi, H. ; Sousa, Leonel

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Univ. of New South Wales, Sydney, NSW, Australia
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    620
  • Lastpage
    625
  • Abstract
    Security in embedded systems is of critical importance since most of our secure transactions are currently made via credit cards or mobile phones. Power analysis based side channel attacks have been proved as the most successful attacks on embedded systems to retrieve secret keys, allowing impersonation and theft. State-of-the-art solutions for such attacks in Elliptic Curve Cryptography (ECC), mostly in software, hinder performance and repeatedly attacked using improved techniques. To protect the ECC from both simple power analysis and differential power analysis, as a hardware solution, we propose to take advantage of the inherent parallelization capability in Multi-modulo Residue Number Systems (RNS) architectures to obfuscate the secure information. Random selection of moduli is proposed to randomly choose the moduli sets for each key bit operation. This solution allows us to prevent power analysis, while still providing all the benefits of RNS. In this paper, we show that Differential Power Analysis is thwarted, as well as correlation analysis.
  • Keywords
    embedded systems; public key cryptography; residue number systems; DARNS; correlation analysis; credit cards; differential power analysis; double-and-add in ECC; elliptic curve cryptography; embedded systems; mobile phones; moduli random selection; multimodulo residue number systems; power analysis side channel attacks; randomized multimodulo RNS architecture; secret keys; Adders; Algorithm design and analysis; Bismuth; Computer architecture; Elliptic curve cryptography; Software; Software algorithms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509667
  • Filename
    6509667