DocumentCode
2075286
Title
A forward body-biased-low-leakage SRAM cache: device and architecture considerations
Author
Kim, Chris H. ; Jae-Joon Kim ; Mukhopadhyay, Saibal ; Roy, Kaushik
Author_Institution
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2003
fDate
25-27 Aug. 2003
Firstpage
6
Lastpage
9
Abstract
This paper presents a forward body-biasing (FBB) scheme for active leakage power reduction in cache memories. We utilize super high VT (threshold voltage) devices to suppress the leakage power in unselected portions of a cache while fast operation is achieved by dynamically forward body-biasing the selected SRAM cells. In order to generate a super high VT device, the 2D halo doping profile was optimized by considering different nanometer regime leakage mechanisms. The transition latency and energy overhead associated with FBB could be minimized by (i) waking up the SRAM cells ahead of the access and (ii) exploiting the cache access pattern. The combined device-circuit-architecture level techniques offer 64% total leakage reduction and 7.3% improvement in bitline delay compared to a previous state-of-the-art low-leakage SRAM technique.
Keywords
SRAM chips; VLSI; cache storage; circuit optimisation; delays; doping profiles; integrated circuit design; leakage currents; low-power electronics; memory architecture; nanoelectronics; 2D halo doping profile; FBB; SRAM cell access; SRAM cells; active leakage power reduction; architecture considerations; bitline delay; cache access pattern; cache memories; cache operation; device considerations; device-circuit-architecture level techniques; dynamic forward body-biasing; energy overhead; forward body-biased-low-leakage SRAM cache; leakage power suppression; leakage reduction; low-leakage SRAM technique; nanometer regime leakage mechanisms; super high threshold voltage devices; transition latency; Buildings; Cache memory; Computer architecture; Delay; Doping profiles; Energy consumption; Nanoscale devices; Permission; Random access memory; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
Print_ISBN
1-58113-682-X
Type
conf
DOI
10.1109/LPE.2003.1231824
Filename
1231824
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