• DocumentCode
    2075514
  • Title

    Fabrication and analysis of vertical p-type InAs-Si nanowire Tunnel FETs

  • Author

    Cutaia, D. ; Moselund, K.E. ; Borg, M. ; Schmid, H. ; Gignac, L. ; Breslin, C.M. ; Karg, S. ; Uccelli, E. ; Nirmalraj, P. ; Riel, H.

  • Author_Institution
    IBM Res. - Zurich, Rüschlikon, Switzerland
  • fYear
    2015
  • fDate
    26-28 Jan. 2015
  • Firstpage
    61
  • Lastpage
    64
  • Abstract
    We report InAs-Si nanowire (NW) Tunnel FETs fabricated inside nanotube templates. High device yield and performances are obtained by optimizing the growth conditions and the fabrication flow using inorganic material as dielectric spacer, atomic-layer-deposition for the metal gate and by scaling the equivalent oxide thickness (EOT). We extract the exponential parameter B of Kane´s tunneling model for direct bandgap (Eg) materials and compare it with experimental results. Moreover, studying the activation energy (EA) for TFETs with different EOTs allows us to distinguish the different conduction mechanisms.
  • Keywords
    III-V semiconductors; atomic layer deposition; energy gap; field effect transistors; indium compounds; nanotube devices; nanowires; optimisation; silicon; tunnel transistors; EOT; InAs-Si; Kane´s tunneling model; NW; TFET; activation energy; atomic layer deposition; conduction mechanisms; dielectric spacer; direct bandgap materials; equivalent oxide thickness; exponential parameter B extraction; fabrication flow optimization analysis; growth condition optimization; high device yield performances; inorganic material; metal gate; nanotube templates; vertical p-type nanowire tunnel FET; Fabrication; Logic gates; Molecular beam epitaxial growth; Photonic band gap; Silicon; Tunneling; IH-V semiconductor materials; Kane model; hetero-junctions; low-power electronics; nanowires; tunnel transistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on
  • Conference_Location
    Bologna
  • Type

    conf

  • DOI
    10.1109/ULIS.2015.7063773
  • Filename
    7063773