DocumentCode
2075528
Title
Stacking signal TSV for thermal dissipation in global routing for 3D IC
Author
Po-Yang Hsu ; Hsien-Te Chen ; TingTing Hwang
Author_Institution
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2013
fDate
22-25 Jan. 2013
Firstpage
699
Lastpage
704
Abstract
With no further shrink of device size, three dimensional (3D) chip stacking by Through-Silicon-VIA (TSV) has been identified as an effective way to achieve better performance in speed and power. However, such solution inevitably encounters challenges in thermal dissipation since stacked dies generate significant amount of heat per unit volume. We leverage an integrated architecture of stacked-signal-TSVs to minimize temperature with small wiring overhead. Based on the structure of stacked signal TSV, a two-stage TSV locating algorithm in global routing is designed. By this TSV locating algorithm, we demonstrate that our stacking signal TSV structure is able to reduce 17% temperature with 4% wiring overhead and 3% performance loss calculated by 3D Elmore delay model. Compared to a previous work by Cong and Zhang [1] where additional thermal TSVs are inserted, our experimental results have in average 23% less TSVs than Cong and Zhang´s [1] with the same temperature constraint.
Keywords
network routing; three-dimensional integrated circuits; 3D IC; global routing; stacked signal TSV; stacking signal TSV; temperature constraint; thermal dissipation; through-silicon-via; Heating; Routing; Stacking; Thermal analysis; Thermal resistance; Three-dimensional displays; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
Conference_Location
Yokohama
ISSN
2153-6961
Print_ISBN
978-1-4673-3029-9
Type
conf
DOI
10.1109/ASPDAC.2013.6509682
Filename
6509682
Link To Document