• DocumentCode
    2075528
  • Title

    Stacking signal TSV for thermal dissipation in global routing for 3D IC

  • Author

    Po-Yang Hsu ; Hsien-Te Chen ; TingTing Hwang

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    22-25 Jan. 2013
  • Firstpage
    699
  • Lastpage
    704
  • Abstract
    With no further shrink of device size, three dimensional (3D) chip stacking by Through-Silicon-VIA (TSV) has been identified as an effective way to achieve better performance in speed and power. However, such solution inevitably encounters challenges in thermal dissipation since stacked dies generate significant amount of heat per unit volume. We leverage an integrated architecture of stacked-signal-TSVs to minimize temperature with small wiring overhead. Based on the structure of stacked signal TSV, a two-stage TSV locating algorithm in global routing is designed. By this TSV locating algorithm, we demonstrate that our stacking signal TSV structure is able to reduce 17% temperature with 4% wiring overhead and 3% performance loss calculated by 3D Elmore delay model. Compared to a previous work by Cong and Zhang [1] where additional thermal TSVs are inserted, our experimental results have in average 23% less TSVs than Cong and Zhang´s [1] with the same temperature constraint.
  • Keywords
    network routing; three-dimensional integrated circuits; 3D IC; global routing; stacked signal TSV; stacking signal TSV; temperature constraint; thermal dissipation; through-silicon-via; Heating; Routing; Stacking; Thermal analysis; Thermal resistance; Three-dimensional displays; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (ASP-DAC), 2013 18th Asia and South Pacific
  • Conference_Location
    Yokohama
  • ISSN
    2153-6961
  • Print_ISBN
    978-1-4673-3029-9
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2013.6509682
  • Filename
    6509682