• DocumentCode
    2075535
  • Title

    Rate dependence of bending fatigue failure characteristics of lead-free solder joint

  • Author

    Bang, Woong Ho ; Chen, Liang-Shan ; Kim, Choong-Un ; Lee, Tae-Kyu ; Liu, Kuo-Chuan

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Univ. of Texas, Arlington, TX
  • fYear
    2009
  • fDate
    26-29 May 2009
  • Firstpage
    2070
  • Lastpage
    2074
  • Abstract
    This study concerns the failure mechanism of a lead-free SAC305 solder joint under the isothermal bending fatigue condition. For this, series of bending fatigue tests are carried out with the variations of bending displacement and frequency, and FEM analysis is conducted to examine the relationship between mechanical behavior of a solder joint and fatigue life cycle. The results of this investigation suggest that the isothermal fatigue of a solder joint is strongly affected by plastic deformation process of SAC solder. It is found that the failure life cycle ´Nf´ fits well to the model suggested by Coffin-Manson, that is Nf ~ (Deltaepsivp)-2.3. This result indicates that fatigue failure is determined by accumulation of damage by plastic deformation of solder. The fractography of a solder joint also supports our conclusion because crack is found to propagate along the solder matrix near to IMC interface.
  • Keywords
    bending; copper alloys; fatigue testing; finite element analysis; plastic deformation; silver alloys; solders; tin alloys; SnAgCu; bending fatigue tests; fatigue life cycle; finite element analysis; isothermal bending fatigue failure; plastic deformation; solder joints; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Failure analysis; Fatigue; Isothermal processes; Lead; Materials science and technology; Plastics; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2009. ECTC 2009. 59th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-4475-5
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2009.5074309
  • Filename
    5074309