DocumentCode :
2075625
Title :
UDSM (ultra-deep sub-micron)-aware post-layout power optimization for ultra low-power CMOS VLSI
Author :
Choi, Kyu-Won ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2003
fDate :
25-27 Aug. 2003
Firstpage :
72
Lastpage :
77
Abstract :
In this paper, we propose an efficient approach to minimize total power (switching, short-circuit, and leakage power) without performance loss for ultra-low power CMOS circuits in nanometer technologies. We present a framework for combining supply/threshold voltage scaling, gate sizing, and interconnect scaling techniques for power optimization and propose an efficient heuristic algorithm which ensures that the total slack budget is maximal and the total power is minimal in the presence of back end (post-layout-based) UDSM effects. We have tested the proposed algorithms on a set of benchmark circuits and some building blocks of a synthesizable ARM core. The experimental results show that our polynomial-time solvable strategy delivers over an order of magnitude savings in total power without compromising performance.
Keywords :
CMOS integrated circuits; circuit optimisation; circuit simulation; integrated circuit design; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; leakage currents; low-power electronics; nanoelectronics; CMOS nanometer technologies; UDSM-aware-post-layout power optimization; back end UDSM effects; benchmark circuits; gate sizing; heuristic algorithm; interconnect scaling; leakage power; low-power design; polynomial-time solvable strategy; post-layout-based UDSM effects; power minimization; short-circuit power; supply/threshold voltage scaling; switching power; synthesizable ARM core building blocks; total slack budget; ultra low-power CMOS VLSI; ultra-deep sub-micron-aware post-layout power optimization; Benchmark testing; CMOS technology; Circuit synthesis; Circuit testing; Heuristic algorithms; Integrated circuit interconnections; Performance loss; Switching circuits; Threshold voltage; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
1-58113-682-X
Type :
conf
DOI :
10.1109/LPE.2003.1231838
Filename :
1231838
Link To Document :
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