DocumentCode
2075684
Title
Simulation of initial stages of Ge nano-island nucleation on Si (111) surface
Author
Reizvikh, Irina A. ; Zverev, Alexey V. ; Teys, Sergey A. ; Yanovitskaya, Zoya Sh
Author_Institution
Novosibirsk State Tech. Univ., Russia
Volume
1
fYear
2002
fDate
1-5 July 2002
Abstract
Reasons of three-layer Ge island nucleation on Si(111) surfaces at low deposition rate at the initial stages of wetting layer formation were investigated. Simulation of Ge epitaxial growth on atomically clean and flat Si(111) surface was carried out by 3D Monte Carlo model. If the activation energy of heterodiffusion of adsorbate along the substrate is less than homodiffusion energies of the adsorbate and the substrate, growth of multilayer islands is observed. However, for this process the great difference between activation energies of homo and heterodiffusion is necessary (about 1 eV). It was suggested that at the borders of the islands the reconstruction of dangling bonds takes place and dimmers are created. Atom attachment into these bonds requires surmounting of some additional energy barrier. Multilayer growth takes place at small difference in activation energies of adsorbate and substrate atoms (∼ 0.2-0.3 cV), when attachment probability to the model dimer sites is decreased.
Keywords
Ge-Si alloys; Monte Carlo methods; adsorption; dangling bonds; defect states; epitaxial growth; nucleation; surface diffusion; 0.2 to 0.3 eV; 3D Monte Carlo model; Ge-Si; Si(111) surface; activation energy; adsorbate atoms; atom attachment; attachment probability; dangling bonds; dimer sites; energy barrier; epitaxial growth; heterodiffusion energy; homodiffusion energy; multilayer growth; multilayer islands; nanoisland nucleation; substrate atoms; wetting layer formation; Atomic layer deposition; Energy barrier; Epitaxial growth; Monte Carlo methods; Nonhomogeneous media; Physics; Surface cleaning; Surface morphology; Surface reconstruction; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Materials, 2002. Proceedings. 3rd Annual 2002 Siberian Russian Workshop on
Print_ISBN
5-7782-0380-2
Type
conf
DOI
10.1109/SREDM.2002.1024311
Filename
1024311
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