Title :
Simulation of initial stages of Ge nano-island nucleation on Si (111) surface
Author :
Reizvikh, Irina A. ; Zverev, Alexey V. ; Teys, Sergey A. ; Yanovitskaya, Zoya Sh
Author_Institution :
Novosibirsk State Tech. Univ., Russia
Abstract :
Reasons of three-layer Ge island nucleation on Si(111) surfaces at low deposition rate at the initial stages of wetting layer formation were investigated. Simulation of Ge epitaxial growth on atomically clean and flat Si(111) surface was carried out by 3D Monte Carlo model. If the activation energy of heterodiffusion of adsorbate along the substrate is less than homodiffusion energies of the adsorbate and the substrate, growth of multilayer islands is observed. However, for this process the great difference between activation energies of homo and heterodiffusion is necessary (about 1 eV). It was suggested that at the borders of the islands the reconstruction of dangling bonds takes place and dimmers are created. Atom attachment into these bonds requires surmounting of some additional energy barrier. Multilayer growth takes place at small difference in activation energies of adsorbate and substrate atoms (∼ 0.2-0.3 cV), when attachment probability to the model dimer sites is decreased.
Keywords :
Ge-Si alloys; Monte Carlo methods; adsorption; dangling bonds; defect states; epitaxial growth; nucleation; surface diffusion; 0.2 to 0.3 eV; 3D Monte Carlo model; Ge-Si; Si(111) surface; activation energy; adsorbate atoms; atom attachment; attachment probability; dangling bonds; dimer sites; energy barrier; epitaxial growth; heterodiffusion energy; homodiffusion energy; multilayer growth; multilayer islands; nanoisland nucleation; substrate atoms; wetting layer formation; Atomic layer deposition; Energy barrier; Epitaxial growth; Monte Carlo methods; Nonhomogeneous media; Physics; Surface cleaning; Surface morphology; Surface reconstruction; Temperature;
Conference_Titel :
Electron Devices and Materials, 2002. Proceedings. 3rd Annual 2002 Siberian Russian Workshop on
Print_ISBN :
5-7782-0380-2
DOI :
10.1109/SREDM.2002.1024311