Title :
A framework for design for testability of mixed analog/digital circuits
Author :
Jarwala, Madhuri ; Tsai, Sheng-Jen
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
Abstract :
Three analog design-for-testability (DFT) schemes used to test the analog portion of a mixed-signal circuit are presented. The mixed-signal device-under-test is partitioned into analog and digital macros and structured access is provided to the analog macros to enhance observability and controllability. The proposed test methodology integrates analog testing with the existing digital test techniques to form a single DFT framework for mixed-signal devices
Keywords :
application specific integrated circuits; integrated circuit testing; DFT framework; analog macros; controllability; design for testability; device-under-test; digital macros; mixed analog/digital circuits; mixed-signal circuit; observability; structured access; test methodology; Analog circuits; Analog-digital conversion; Built-in self-test; Circuit testing; Controllability; Design for testability; Digital circuits; Observability; Switching converters; System testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0015-7
DOI :
10.1109/CICC.1991.164054
