DocumentCode
2075707
Title
A framework for design for testability of mixed analog/digital circuits
Author
Jarwala, Madhuri ; Tsai, Sheng-Jen
Author_Institution
AT&T Bell Lab., Princeton, NJ, USA
fYear
1991
fDate
12-15 May 1991
Abstract
Three analog design-for-testability (DFT) schemes used to test the analog portion of a mixed-signal circuit are presented. The mixed-signal device-under-test is partitioned into analog and digital macros and structured access is provided to the analog macros to enhance observability and controllability. The proposed test methodology integrates analog testing with the existing digital test techniques to form a single DFT framework for mixed-signal devices
Keywords
application specific integrated circuits; integrated circuit testing; DFT framework; analog macros; controllability; design for testability; device-under-test; digital macros; mixed analog/digital circuits; mixed-signal circuit; observability; structured access; test methodology; Analog circuits; Analog-digital conversion; Built-in self-test; Circuit testing; Controllability; Design for testability; Digital circuits; Observability; Switching converters; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1991., Proceedings of the IEEE 1991
Conference_Location
San Diego, CA
Print_ISBN
0-7803-0015-7
Type
conf
DOI
10.1109/CICC.1991.164054
Filename
164054
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