DocumentCode
2075939
Title
An ASIC design methodology with predictably low leakage, using leakage-immune standard cells
Author
Jayakumar, Nikhil ; Khatri, Sunil P.
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear
2003
fDate
25-27 Aug. 2003
Firstpage
128
Lastpage
133
Abstract
In this paper we introduce a low-leakage standard cell based ASIC design methodology which is based on the use of modified standard cells. These cells are designed to consume extremely low and predictable leakage currents in standby mode. For each cell in a standard cell library, we design two low-leakage variants of the cell. If the inputs of a cell during the standby mode of operation are such that the output has a high value, we minimize the leakage in the pull-down network, and vice versa. While technology mapping a circuit, we determine the particular variant to utilize in each instance, so as to minimize leakage of the final mapped design. We have designed and laid out our modified standard cells, and have performed experiments to compare placed-and-routed area, leakage and delays of our method against MTCMOS and a straightforward ASIC flow. Each design style we compare utilizes the same base standard cell library. Our results show that designs obtained using our methodology have better speed and area characteristics than designs implemented in MTCMOS. The exact leakage current obtained for MTCMOS is highly unpredictable, while our method exhibits leakage currents which are precisely estimable. The leakage current for HL designs can be dramatically lower than the worst-case leakage of MTCMOS based designs, and two orders of magnitude compared to traditional standard cells. Also, a design implemented in MTCMOS would require the use of separate power and ground supplies for latches and combinational logic, while our methodology does away with such a requirement.
Keywords
CMOS integrated circuits; application specific integrated circuits; cellular arrays; circuit CAD; combinational circuits; delays; flip-flops; integrated circuit design; leakage currents; logic design; ASIC design methodology; HL designs; MTCMOS; area characteristics; combinational logic; delays; extremely low predictable leakage currents; final mapped design; ground supplies; latches; leakage-immune standard cells; low-leakage cell variants; low-leakage standard cell based ASIC design methodology; modified standard cells; placed-and-routed area; power supplies; pull-down network leakage; speed characteristics; standard cell library; standby mode operation; technology mapping; Application specific integrated circuits; Delay; Design methodology; Equations; Intrusion detection; Leakage current; Libraries; Permission; Threshold voltage; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
Print_ISBN
1-58113-682-X
Type
conf
DOI
10.1109/LPE.2003.1231848
Filename
1231848
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