Printed-Circuit Analysis by a New Mode-Matching Method Based on the Edge-Effect Theory

A new mode-matching method is proposed here for printed-circuit analysis, which considers the field-continuity conditions via the aperture field expanded into finite series of singular functions. In this sense, our approach seems to be similar with the spectral-domain method, but the aperture plane is taken along a perfectly different direction. Effectiveness of this method in numerical handling is proved by the dispersion calculations of microstrip lines with isotropic and anisotropic substrates.