• DocumentCode
    2076876
  • Title

    Application of immune clustering algorithm to analog circuit fault diagnosis

  • Author

    YanFei, Li ; JinZeng, Chen ; ZhiYang, Pang

  • Author_Institution
    Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan, China
  • fYear
    2011
  • fDate
    16-18 Dec. 2011
  • Firstpage
    1743
  • Lastpage
    1746
  • Abstract
    As a new type of pattern recognition method, the immune clustering algorithm is successfully applied to deal with analog circuit fault diagnosis problem. Firstly, exact the fault characteristics of the circuit based on principal component analysis method. Then, calculate the clustering center as the antibody of each circuit status based on clone selection algorithm, which is so-called immunological tolerance. Lastly, regarding the testing sample as antigen, estimate the circuit status through antigen-antibody discrimination. The results show that this fault diagnosis method has high fault-coverage rate, and is easy to realize.
  • Keywords
    analogue circuits; artificial immune systems; fault diagnosis; pattern clustering; principal component analysis; analog circuit fault diagnosis; antigen-antibody discrimination; clone selection algorithm; clustering center; fault-coverage rate; immune clustering algorithm; immunological tolerance; pattern recognition; principal component analysis; Analog circuits; Circuit faults; Cloning; Clustering algorithms; Fault diagnosis; Immune system; Testing; analog circuit; artificial immune system; fault diagnosis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transportation, Mechanical, and Electrical Engineering (TMEE), 2011 International Conference on
  • Conference_Location
    Changchun
  • Print_ISBN
    978-1-4577-1700-0
  • Type

    conf

  • DOI
    10.1109/TMEE.2011.6199549
  • Filename
    6199549