DocumentCode :
2076997
Title :
TestFul: automatic unit-test generation for Java classes
Author :
Baresi, Luciano ; Miraz, Matteo
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Volume :
2
fYear :
2010
fDate :
2-8 May 2010
Firstpage :
281
Lastpage :
284
Abstract :
This paper presents TestFul, an Eclipse plugin for the generation of tests for Java classes. It is based on the idea of search-based testing, working both at class and method level. The former puts objects in useful states, used by the latter to exercise the uncovered parts of the class.
Keywords :
Java; automatic test pattern generation; program testing; Eclipse plugin; Java class; automatic unit test generation; search-based testing; Evolutionary computation; Graphical user interfaces; Java; Search problems; Software; Software testing; Java classes; search-based testing; test generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, 2010 ACM/IEEE 32nd International Conference on
Conference_Location :
Cape Town
ISSN :
0270-5257
Print_ISBN :
978-1-60558-719-6
Type :
conf
DOI :
10.1145/1810295.1810353
Filename :
6062179
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2076997
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