• DocumentCode
    2077296
  • Title

    Adaptive frequency distribution for Electrical Bioimpedance Spectroscopy measurements

  • Author

    Seoane, Fernando ; Ferreira, J. A. ; Buendia, R. ; Lindecrantz, K.

  • Author_Institution
    Sch. of Technol. & Health, KTH R. Inst. of Technol., Huddinge, Sweden
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    562
  • Lastpage
    565
  • Abstract
    This paper presents a novel frequency distribution scheme intended to provide more accurate estimations of Cole parameters. Nowadays a logarithmic frequency distribution is mostly used in Electrical Bioimpedance Spectroscopy (EBIS) applications. However it is not optimized following any criterion. Our hypothesis is that an EBIS signal contains more information where the variation of the measurement regarding the frequency is larger; and that there ought to be more measuring frequencies where there is more information. Results show that for EBIS data with characteristic frequencies up to 200 kHz the error obtained with both frequency distribution schemes is similar. However, for EBIS data with higher values of characteristic frequency the error produced when estimating the values from EBIS measurements using an adaptive frequency distribution is smaller. Thus it may useful for EBIS applications with high values of characteristic frequency, e.g. cerebral bioimpedance.
  • Keywords
    bioelectric phenomena; electric impedance measurement; Cole parameter; EBIS signal; adaptive frequency distribution; cerebral bioimpedance; electrical bioimpedance spectroscopy; frequency distribution scheme; logarithmic frequency distribution; Bioimpedance; Frequency estimation; Impedance; Impedance measurement; Radio spectrum management; Spectroscopy; Brain; Dielectric Spectroscopy; Electric Impedance; Humans; Least-Squares Analysis; Nonlinear Dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6345993
  • Filename
    6345993