An event-driven transient simulation algorithm for MOS and bipolar circuits

Author

Patrick, D. ; Lyden, C.

Author_Institution

Nat. Microelectron. Res. Center, Cork, Ireland

fYear

1990

fDate

12-15 Mar 1990

Firstpage

230

Lastpage

234

Abstract

SUGAR is a program for fast transient simulation of MOS circuits The paper describes the extension to the algorithm to handle bipolar and BiCMOS circuits. The authors believe that SUGAR is the first event driven circuit simulator which successfully simulates bipolar circuits. The algorithm uses both dynamic and static circuit partitioning to identify closely coupled nodes, and performs simultaneous equation solutions on the coupled nodes. A number of other extensions have been made to the algorithm to facilitate BJT simulations

Keywords

BIMOS integrated circuits; CMOS integrated circuits; bipolar integrated circuits; circuit analysis computing; BJT simulations; BiCMOS circuits; MOS circuits; SUGAR; bipolar circuits; closely coupled nodes; dynamic circuit partitioning; event driven circuit simulator; event-driven transient simulation algorithm; simultaneous equation solutions; static circuit partitioning; Analog circuits; Capacitance; Circuit simulation; Coupling circuits; Delay; Discrete event simulation; Partitioning algorithms; SPICE; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1990., EDAC. Proceedings of the European

Conference_Location

Glasgow

Print_ISBN

0-8186-2024-2

Type

conf

DOI

10.1109/EDAC.1990.136650

Filename

136650