DocumentCode :
2077522
Title :
A preliminary experimental study on optimal feature selection for product derivation using knapsack approximation
Author :
Shi, Runyu ; Guo, Jianmei ; Wang, Yinglin
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Volume :
1
fYear :
2010
fDate :
10-12 Dec. 2010
Firstpage :
665
Lastpage :
669
Abstract :
Software product lines (SPLs) technology produce software by integrating reusable software components based on customer requirements. Current researchers pay great attention to feature modeling technology that can represent SPLs´ production requirements and functionalities. A key challenge is selecting valid and optimal feature combinations from the feature model to satisfy various requirements of customers and vendors, including various value and cost constraints. This paper experimentally studies a knapsack approximation algorithm of feature selection for automated product derivation in SPLs. Our approach generates an approximation solution by a modified Filtered Cartesian Flattening algorithm and obtains the optimal solution with a greed search. We performed experiments on randomly generated feature models with different characteristics. Experiments show that our approach can select highly optimal feature combinations effectively.
Keywords :
approximation theory; customer services; greedy algorithms; knapsack problems; random processes; search problems; software reusability; automated product derivation; cost constraints; customer requirements; feature modeling technology; greed search; knapsack approximation algorithm; modified filtered Cartesian flattening algorithm; optimal feature combinations; optimal feature selection; product derivation; production requirements; randomly generated feature models; reusable software component; software product line technology; value constraints; Artificial neural networks; Random access memory; approximation algorithm; feature models; product derivation; software product lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-6788-4
Type :
conf
DOI :
10.1109/PIC.2010.5687874
Filename :
5687874
Link To Document :
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