Title :
The effect of automatic blink correction on auditory evoked potentials
Author :
Korpela, Joseph ; Vigario, Ricardo ; Huotilainen, M.
Author_Institution :
Brain Work Res. Centre, Finnish Inst. of Occupational Health, Helsinki, Finland
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
The effects of blink correction on auditory event-related potential (ERP) waveforms is assessed. Two blink correction strategies are compared. ICA-SSP combines independent component analysis (ICA) with signal space projection (SSP) and ICA-EMD uses empirical mode decomposition (EMD) to improve the performance of the standard ICA method. Five voluntary subjects performed an auditory oddball task. The resulting ERPs are used to compare the two blink correction methods to each other and against blink rejection. The results suggest that both methods qualitatively preserve the ERP waveform but that they underestimate some of the peak amplitudes. ICA-EMD performs slightly better than ICA-SSP. In conclusion, the use of blink correction is justified, especially if blink rejection leads to severe data loss.
Keywords :
auditory evoked potentials; biomechanics; electro-oculography; electroencephalography; independent component analysis; medical signal processing; signal reconstruction; vision; EEG recordings; EOG activity; auditory event-related potential waveforms; auditory evoked potentials; auditory oddball task; automatic blink correction effect; blink rejection; electroencephalographic recordings; electrooculographic activity; empirical mode decomposition; independent component analysis; signal space projection; standard ICA method; Algorithm design and analysis; Brain modeling; Electroencephalography; Electrooculography; Independent component analysis; Standards; Adult; Algorithms; Artifacts; Blinking; Electroencephalography; Electrooculography; Evoked Potentials, Auditory; Humans; Pilot Projects; Principal Component Analysis;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346009