Title :
A new ASIC for the measurement of appearance
Author :
Andreadis, I. ; Gasteratos, A. ; Tsalides, Ph.
Author_Institution :
Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
Abstract :
This paper presents the design and VLSI implementation of a new color space converter chip which performs the conversion, in real-time, of the X, Y and Z color coordinates to the CIE L*u*v* perceptually uniform color space. The high speed of operation is achieved by pipelining the data in a vector fashion. The module is implemented using a DLM, 0.7 μm, N-well, CMOS technology process and it occupies a silicon area of 5.73 mm×5.59 mm 32.03 mm2. Its maximum speed of operation is 20 MHz and its throughput rate of operation is 200 MIPS. Targeted applications include display device modelling (matching of computer image processing to human sensing), device independent color reproduction, colorimetry instrumentation, and color machine vision applications
Keywords :
CMOS integrated circuits; VLSI; analogue-digital conversion; application specific integrated circuits; colorimetry; colour graphics; computer vision; digital signal processing chips; human factors; image colour analysis; image matching; pipeline processing; visual perception; 0.7 micron; 20 MHz; 200 MIPS; ASIC; CIE perceptually uniform color space; N-well CMOS technology; VLSI implementation; appearance measurement; color coordinates conversion; color machine vision application; color space converter chip; colorimetry instrumentation; data pipelining; device independent color reproduction; display device modelling; high speed of operation; real-time conversion; vector conversion; Application software; Application specific integrated circuits; CMOS process; CMOS technology; Color; Computer displays; Pipeline processing; Semiconductor device measurement; Space technology; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507442
