DocumentCode :
2078158
Title :
Exploiting program hotspots and code sequentiality for instruction cache leakage management
Author :
Hu, J.S. ; Nadgir, A. ; Vijaykrishnan, N. ; Irwin, M.J. ; Kandemir, M.
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
fYear :
2003
fDate :
25-27 Aug. 2003
Firstpage :
402
Lastpage :
407
Abstract :
Leakage energy optimization for caches has been the target of much recent effort. In this work, we focus on instruction caches and tailor two techniques that exploit the two major factors that shape the instruction access behavior, namely, hotspot execution and sequentiality. First, we adopt a hotspot detection mechanism by profiling the branch behavior at runtime and utilize this to implement a HotSpot based Leakage Management (HSLM) mechanism. Second, we exploit code sequentiality in implementing a Just-InTime Activation (JITA) that transitions cache lines to active mode just before they are accessed.,We utilize the recently proposed drowsy cache that dynamically scales voltages for leakage reduction and implement various schemes that use different combinations of HSLM and JITA. Our experimental evaluation using the SPEC2000 benchmark suite shows that instruction cache leakage energy consumption can be reduced by 63%, 49% and 29%; on the average, as compared to an unoptimized cache, a recently proposed hardware optimized cache, and a cache optimized using compiler, respectively. Further, we observe that these energy savings can be obtained without a significant impact on performance.
Keywords :
cache storage; instruction sets; just-in-time; leakage currents; low-power electronics; memory architecture; program compilers; SPEC2000 benchmark suite; code execution; code sequentiality; design space exploration; drowsy cache; energy savings; hotspot execution; instruction cache leakage management; just-in-time activation; leakage current; leakage energy optimization; memory hierarchy; multiplexed supply voltage; program hotspots; simulation parameters; Computer science; Energy consumption; Energy management; Engineering management; Leakage current; Permission; Power engineering and energy; Threshold voltage; Turning; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
1-58113-682-X
Type :
conf
DOI :
10.1109/LPE.2003.1231936
Filename :
1231936
Link To Document :
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