DocumentCode :
2079132
Title :
Reducing Test Cost and Improving Documentation In TDD (Test Driven Development)
Author :
Karamat, Taha ; Jamil, Atif Neuman
Author_Institution :
Dept. of Comput. Sci., COMSATS Inst. of Inf. Technol., Abbottabad
fYear :
2006
fDate :
19-20 June 2006
Firstpage :
73
Lastpage :
76
Abstract :
In the fast pace business world of today where competition and technology are at their zenith, software development companies need to improve their quality standards in addition to cost reduction in operations. To achieve these challenging objectives various developments are on the verge. In recent past agile methodologies have emerged as one of the most efficient implementations in the world of software development arena. Especially eXtreme programming (XP) which is integrated by test first approach recent research proves the emergence of test driven development (TDD) from this concept which is based on formalizing the requirement as a test and secondly to write such a code that can pass the test. This attempt of our research provides a mechanism to reduce the cost of testing, mainly due to troublesome test which fails again and again. We used TDD, analyzed the problem and proposed a workable solution. Test driven development is a technique which encourages less documentation resulting in a lot of difficulties for developers in contrast to traditional methods. In order to reduce the burden on developers we have proposed some steps in documentation
Keywords :
program testing; software cost estimation; software quality; software standards; eXtreme programming; software development; software quality standards; test cost reduction; test driven development; Companies; Computer science; Costs; Documentation; Information technology; Life testing; Programming; Software quality; Software standards; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, 2006. SNPD 2006. Seventh ACIS International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7695-2611-X
Type :
conf
DOI :
10.1109/SNPD-SAWN.2006.59
Filename :
1640669
Link To Document :
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