Title :
A practical pattern recognition system for translation, scale and rotation invariance
Author :
Kim, Whoi-Yul ; Yuan, Po
Author_Institution :
Erik Jonsson Sch. of Eng. & Comput. Sci., Texas Univ., Richardson, TX, USA
Abstract :
We present a practical pattern recognition system that is invariant with respect to translation, scale and rotation of objects. The system is also insensitive to large variations of the threshold used. As feature vectors, Zernike moments are used and we compare them with Hu´s seven moment invariants. For a practical machine vision system, three key issues are discussed: pattern normalization, fast computation of Zernike moments, and classification using k-NN rule. As testing results, the system recognizes a set of 62 alphanumeric machine-printed characters with different sizes, at arbitrary orientations, and with different thresholds where the size of the characters varies from 10×10 to 512×512 pixels
Keywords :
computer vision; pattern recognition; Zernike moments; feature vectors; image classification; k-NN rule; machine vision; moment invariants; pattern normalization; pattern recognition system; rotation invariance; scale; translation; Machine vision; Pattern classification;
Conference_Titel :
Computer Vision and Pattern Recognition, 1994. Proceedings CVPR '94., 1994 IEEE Computer Society Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
0-8186-5825-8
DOI :
10.1109/CVPR.1994.323856