Title :
Dielectric properties of SF6/N2 gas mixtures on a full scale model of the gas-insulated busbar
Author :
Hoshina, Y. ; Sato, M. ; Murase, H. ; Toyada, M. ; Kobayashi, A.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
Abstract :
Investigations of the dielectric properties of SF6, N 2 and mixtures have been carried out using a full scale model of a gas-insulated busbar (GIB). The breakdown characteristics under clean conditions are similar to those in a uniform field gas gap. The breakdown voltage is the maximum in SF6 and the minimum in N 2, and shows positive synergism in gas mixtures. The breakdown voltages were proportional to the SF6 content raised to the power of 0.12-0.24. In gas mixture at 0.5 MPa, the peculiar breakdown characteristics under particle attached conditions were obtained. The characteristics are dependent on applied voltage waveform. Under power frequency voltage, dielectric strength of gas mixtures in a particular SF6 concentration range is higher than that of pure SF6. In gas mixtures, the partial discharges behavior should be related to the increase of breakdown voltage. Under negative lightning impulse voltage, an addition of small amounts of SF6 to N2 results in a decrease of breakdown voltage. The negative ion should play an important role on this behavior
Keywords :
SF6 insulation; busbars; electric strength; gas mixtures; insulation testing; nitrogen; partial discharges; power cable insulation; power cable testing; 0.5 MPa; N2; SF6; SF6/N2 gas mixtures; applied voltage waveform; breakdown characteristics; breakdown voltage; dielectric properties; dielectric strength; gas-insulated busbar; negative lightning impulse voltage; partial discharges behavior; particle attached conditions; power frequency voltage; Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Frequency; Gas insulation; Lightning; Power transformer insulation; Sulfur hexafluoride; Surface contamination; Switchgear;
Conference_Titel :
Power Engineering Society Winter Meeting, 2000. IEEE
Print_ISBN :
0-7803-5935-6
DOI :
10.1109/PESW.2000.847682