DocumentCode
2080311
Title
Full polarimetric SAR classification based on Yamaguchi decomposition model and scattering parameters
Author
Han, Yang ; Shao, Yongshe
Author_Institution
Dept. of Surveying & Geo-Inf., Tongji Univ., Shanghai, China
Volume
2
fYear
2010
fDate
10-12 Dec. 2010
Firstpage
1104
Lastpage
1108
Abstract
The full polarimetric information of the target from polarized Synthetic Aperture Radar (POLSAR) enables us to implement recognition and classification of remote sensing images more effectively. Based on the analysis of typical polarized target decomposition and classification, the issue proposes a new scheme for iterative classification of polarimetric SAR image, which blends the outcomes of Yamaguchi decomposition and H/α decomposition. This technique extracts four decomposition coefficients of four scattering mechanism components through Yamaguchi decomposition, the scattering entropy and angle through H/α decomposition first; then the initial classification of the POLSAR images is done by the combination of the 6 parameters mentioned above. The final result is obtained by iterative classification due to coherence scattering matrix following wishart distribution. The effectiveness of this method plus less computation required is demonstrated by the experimental results of polarimetric SAR data.
Keywords
S-parameters; decomposition; entropy; image classification; radar imaging; radar polarimetry; remote sensing; synthetic aperture radar; H/α decomposition; Yamaguchi decomposition model; coherence scattering matrix; iterative classification; polarimetric SAR image classification; polarized synthetic aperture radar; remote sensing image; scattering entropy; scattering parameter; typical polarized target decomposition; wishart distribution; Buildings; Entropy; Image segmentation; Integrated circuits; Matrix decomposition; Pixel; Vegetation mapping; Yamaguchi decomposition; imaging classification; polsar; scattering angle; scattering entropy;
fLanguage
English
Publisher
ieee
Conference_Titel
Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-6788-4
Type
conf
DOI
10.1109/PIC.2010.5687997
Filename
5687997
Link To Document