• DocumentCode
    2080893
  • Title

    Production and characteristics of Sensor Corrected and geocoded ellipsoid corrected products

  • Author

    Liu, Bin ; Zhang, Guo ; Pan, Hongbo ; Jiang, Wanshou

  • Author_Institution
    State Key Lab. of Inf. Eng. in Surveying, Wuhan Univ., Wuhan, China
  • Volume
    2
  • fYear
    2010
  • fDate
    10-12 Dec. 2010
  • Firstpage
    796
  • Lastpage
    799
  • Abstract
    In applications of high-resolution spaceborne imagery, different users have different requirements for accuracy and the form of the product. The commercial high-resolution satellites use their own geometric product level to adapt to different users. But various satellites have different geometric product levels. To establish a suitable optical pushbroom satellite geometry product level becomes the key to the development of optical satellite technical issues placed before us. This paper presents a geometric product level as standard and the production methods of the Sensor Corrected level and the Geocoded Ellipsoid Corrected level are given based on the standard. A case study using the ALOS satellite has been used to test the methods. Experimental results show that the Sensor Corrected Level Product performs very well in image stitching, and the Geocoded Ellipsoid Corrected Level Product solves the low accuracy of the RFM (rational function model) caused by the jumping of exterior orientation elements.
  • Keywords
    CCD image sensors; artificial satellites; image resolution; rational functions; ALOS satellite; geocoded ellipsoid corrected products; high resolution spaceborne imagery; high-resolution satellites; image stitching; optical pushbroom; rational function model; satellite geometry product level; sensor corrected products; Continuous wavelet transforms; Radiometry; ALOS; Geocoded Ellipsoid Corrected product; Geometric Product Level; RFM; Sensor Corrected product; component;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Progress in Informatics and Computing (PIC), 2010 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-6788-4
  • Type

    conf

  • DOI
    10.1109/PIC.2010.5688021
  • Filename
    5688021