• DocumentCode
    2081121
  • Title

    An area efficient high turn ratio monolithic transformer for silicon RFIC

  • Author

    Lim, Chee Chong ; Yeo, Kiat Seng ; Chew, Kok Wai ; Lim, Suh Fei ; Boon, Chirn Chye ; Ping, Qiu ; Do, Manh Anh ; Chan, Lap

  • Author_Institution
    Nanyang Technol. Univ., Singapore
  • fYear
    2008
  • fDate
    June 17 2008-April 17 2008
  • Firstpage
    167
  • Lastpage
    170
  • Abstract
    A novel way of manufacturing an on-chip transformer that produces high inductance ratio (LSec/LPri > 30) with excellent area efficiency is presented. This technique uses an electrical all-round coupling effect of a conductor A (primary coil), having large effective width, and a densely routed conductor B (secondary coil). Thus, a high turn ratio monolithic transformer, using minimum die size, is realizable on silicon. The coil having the dense routing can also be doubled up as a monolithic RF choke on silicon. In this work, area efficiency is compared between various type of existing transformer structures (i.e. interleaved and stacked transformer), based on unit inductance. The method presented is fully compatible to all the foundry standard CMOS processes.
  • Keywords
    CMOS integrated circuits; high-frequency transformers; radiofrequency integrated circuits; CMOS processes; area efficient high turn ratio monolithic transformer; densely routed conductor; electrical all-round coupling effect; high inductance ratio; interleaved transformer; on-chip transformer; primary coil; secondary coil; silicon RFIC; stacked transformer; Coils; Conductors; Couplings; Inductance; Inductors; Manufacturing; Radio frequency; Radiofrequency integrated circuits; Routing; Silicon; Coupling coefficient; High Turn Ratio transformer; Inductance Ratio; Interleaved transformer; RFCMOS; SoC; Stacked transformer; Vertical Deck;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-1808-4
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2008.4561410
  • Filename
    4561410