• DocumentCode
    2081242
  • Title

    Phase noise in oscillators: a unifying theory and numerical methods for characterisation

  • Author

    Demir, Alper ; Mehrotra, Amit ; Roychowdhury, Jaijeet

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1998
  • fDate
    19-19 June 1998
  • Firstpage
    26
  • Lastpage
    31
  • Abstract
    Phase noise is a topic of theoretical and practical interest in electronic circuits, as well as in other fields such as optics. Although progress has been made in understanding the phenomenon, there still remain significant gaps, both in its fundamental theory and in numerical techniques for its characterisation. In this paper, we develop a solid foundation for phase noise that is valid for any oscillator, regardless of operating mechanism. We establish novel results about the dynamics of stable nonlinear oscillators in the presence of perturbations, both deterministic and random. We obtain an exact, nonlinear equation for phase error, which we solve without approximations for random perturbations. This leads us to a precise characterisation of timing jitter and spectral dispersion, for computing which we develop efficient numerical methods. We demonstrate our techniques on practical electrical oscillators, and obtain good matches with measurements even at frequencies close to the carrier, where previous techniques break down.
  • Keywords
    circuit noise; circuit stability; jitter; nonlinear network analysis; oscillators; phase noise; spectral analysis; electrical oscillators; nonlinear equation; numerical methods; oscillator phase noise; phase error; random perturbations; spectral dispersion; stable nonlinear oscillators; timing jitter; unifying theory; Electric variables measurement; Electronic circuits; Frequency measurement; Nonlinear equations; Nonlinear optics; Optical noise; Oscillators; Phase noise; Solids; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1998. Proceedings
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-89791-964-5
  • Type

    conf

  • Filename
    724434