DocumentCode :
2081325
Title :
Development of reflowable Sn-Pb alloy bump for Al pad
Author :
Ogashiwa, Toshinori ; Arikawa, Takatoshi ; Inoue, Akihisa
Author_Institution :
Tanaka Denshi Kogyo Co. Ltd., Mitaka, Japan
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
664
Lastpage :
669
Abstract :
A direct soldering material with Al thin-film pad has been examined for a bare flip-chip bonding on Printed Wiring Board. A solder ball made from the. 59.6Sn-29Pb-5Sb-1Zn-5Ag-0.2Cu-0.2Ni (mass%) alloy wire was thermosonically bonded on the Al-1%Si pad by using a conventional bump bonding machine. For fine-pitch bonding, the strain of ball deformation can be reduced by finding the optimum value of the ultrasonic power for bond strength and ellipticity of the bonded bump. After reflow treatment up to 300°C, no significant degradation of the bump shear force was observed. The concentration of Ag, Cu and Ni in the Al film interface results in an improvement in heat-resistance at the bond interface against the high reflow temperatures. Furthermore, the consistency of measured resistance values during thermal cycling, high-temperature and high-humidity and pressure cooker tests were sufficient enough to put into practical use in epoxy encapsulated flip-chip assemblies
Keywords :
aluminium; fine-pitch technology; flip-chip devices; lead alloys; lead bonding; printed circuit manufacture; reflow soldering; tin alloys; 300 C; Al; Al thin-film pad; Sn-Pb; Sn-Pb alloy bump; bond strength; ellipticity; epoxy encapsulation; fine-pitch bonding; flip-chip bonding; heat resistance; high humidity; high temperature; interface; pressure cooker; printed wiring board; reflow solder ball; shear force; strain; thermal cycling; thermosonic bonding; ultrasonic power; Aluminum alloys; Bonding; Capacitive sensors; Soldering; Temperature; Thermal degradation; Thermal resistance; Transistors; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606242
Filename :
606242
Link To Document :
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