• DocumentCode
    2081624
  • Title

    Surrogate ranking for very expensive similarity queries

  • Author

    Xu, Fei ; Jampani, Ravi ; Wu, Mingxi ; Jermaine, Chris ; Kahveci, Tamer

  • Author_Institution
    CISE Dept., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2010
  • fDate
    1-6 March 2010
  • Firstpage
    848
  • Lastpage
    859
  • Abstract
    We consider the problem of similarity search in applications where the cost of computing the similarity between two records is very expensive, and the similarity measure is not a metric. In such applications, comparing even a tiny fraction of the database records to a single query record can be orders of magnitude slower than reading the entire database from disk, and indexing is often not possible. We develop a general-purpose, statistical framework for answering top-k queries in such databases, when the database administrator is able to supply an inexpensive surrogate ranking function that substitutes for the actual similarity measure. We develop a robust method that learns the relationship between the surrogate function and the similarity measure. Given a query, we use Bayesian statistics to update the model by taking into account the observed partial results. Using the updated model, we construct bounds on the accuracy of the result set obtained via the surrogate ranking. Our experiments show that our models can produce useful bounds for several real-life applications.
  • Keywords
    Bayes methods; data mining; query formulation; query processing; Bayesian statistics; computing cost; database administrator; database records; expensive similarity queries; query record; similarity search; surrogate ranking; top-k queries; Application software; Atomic measurements; Biochemistry; Computer science; Costs; Databases; Drugs; Indexing; Proteins; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Engineering (ICDE), 2010 IEEE 26th International Conference on
  • Conference_Location
    Long Beach, CA
  • Print_ISBN
    978-1-4244-5445-7
  • Electronic_ISBN
    978-1-4244-5444-0
  • Type

    conf

  • DOI
    10.1109/ICDE.2010.5447888
  • Filename
    5447888