Title : 
Error exponents for Rayleigh fading multi-keyhole MIMO channels
         
        
            Author : 
Jiang Xue ; Sarkar, M.Z.I. ; Ratnarajah, Tharm
         
        
            Author_Institution : 
IDCOM, Univ. of Edinburgh, Edinburgh, UK
         
        
        
        
        
        
            Abstract : 
Along with the channel capacity, the error exponent is one of the most important information-theoretic measures of reliability, as it sets ultimate bounds on the performance of communication systems employing codes of finite complexity. In this paper, we derive the closed-form expressions for the Gallager´s random coding and expurgated error exponents for Rayleigh fading multi-keyhole multiple-input multiple-output (MIMO) channels, which provides insight into an elementary tradeoff between the communication reliability and information rate. Moreover, we can easily compute the necessary codeword length without the extensive Monte-Carlo simulation to achieve predefined error probability at a given rate. In addition, we derive the exact closed-form expressions for the ergodic capacity and cutoff rate based on the easily computable Meijer G-function. We also quantify the effects of the number of antennas, channel coherence time and the number of keyholes on the required codeword length to achieve a certain decoding error probability.
         
        
            Keywords : 
MIMO communication; Monte Carlo methods; Rayleigh channels; channel capacity; communication complexity; error statistics; simulation; telecommunication network reliability; Gallager random coding; Meijer G-function; Monte Carlo simulation; Rayleigh fading multikeyhole MIMO channels; channel capacity; communication reliability; elementary tradeoff; error exponents; error probability; finite complexity; information-theoretic measures; multiple-input multiple-output channels; Coherence; Error probability; MIMO; Rayleigh channels; Reliability; Signal to noise ratio; Cutoff rate; error exponent; multi-keyhole MIMO channels; reliability;
         
        
        
        
            Conference_Titel : 
Communications (ICC), 2013 IEEE International Conference on
         
        
            Conference_Location : 
Budapest
         
        
        
        
            DOI : 
10.1109/ICC.2013.6655032