DocumentCode
2081788
Title
Integrating hierarchical test benches into an evolving VHDL design environment
Author
Sullivan, Michael F. ; Bondi, James O. ; Kopca, David J. ; Patel, Nayan D.
Author_Institution
Dept. of Microelecton., Texas Instrum. Inc., Dallas, TX, USA
fYear
1994
fDate
1-4 May 1994
Firstpage
76
Lastpage
78
Abstract
Flexible, hierarchical test benches are developed naturally as part of the normal model development process and support VHDL, WAVES, and company-proprietary standards. The integration of these tool-automated VHDL test benches is described. In TI-Microelectronics, automated development of VHDL test benches and integration of test bench development into the VHDL modeling process are being employed successfully. The novel hierarchical structuring technique described integrates automated VHDL test bench capabilities with the historical TI proprietary design environment
Keywords
circuit CAD; integrated circuit testing; specification languages; TI Test Description Language; TI-Microelectronics; WAVES; evolving VHDL design environment; hierarchical test benches; Automatic testing; Bonding; Electronic equipment testing; Electronic mail; Instruments; Integrated circuit modeling; Integrated circuit testing; Microelectronics; Standards development; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VHDL International Users Forum. Spring Conference, 1994. Proceedings of
Conference_Location
Oakland, CA
Print_ISBN
0-8186-6215-8
Type
conf
DOI
10.1109/VIUF.1994.323963
Filename
323963
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