• DocumentCode
    2081788
  • Title

    Integrating hierarchical test benches into an evolving VHDL design environment

  • Author

    Sullivan, Michael F. ; Bondi, James O. ; Kopca, David J. ; Patel, Nayan D.

  • Author_Institution
    Dept. of Microelecton., Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    76
  • Lastpage
    78
  • Abstract
    Flexible, hierarchical test benches are developed naturally as part of the normal model development process and support VHDL, WAVES, and company-proprietary standards. The integration of these tool-automated VHDL test benches is described. In TI-Microelectronics, automated development of VHDL test benches and integration of test bench development into the VHDL modeling process are being employed successfully. The novel hierarchical structuring technique described integrates automated VHDL test bench capabilities with the historical TI proprietary design environment
  • Keywords
    circuit CAD; integrated circuit testing; specification languages; TI Test Description Language; TI-Microelectronics; WAVES; evolving VHDL design environment; hierarchical test benches; Automatic testing; Bonding; Electronic equipment testing; Electronic mail; Instruments; Integrated circuit modeling; Integrated circuit testing; Microelectronics; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VHDL International Users Forum. Spring Conference, 1994. Proceedings of
  • Conference_Location
    Oakland, CA
  • Print_ISBN
    0-8186-6215-8
  • Type

    conf

  • DOI
    10.1109/VIUF.1994.323963
  • Filename
    323963