DocumentCode
2082406
Title
A high-linearity, LC-Tuned, 24-GHz T/R switch in 90-nm CMOS
Author
Park, Piljae ; Shin, Dong Hun ; Pekarik, John J. ; Rodwell, Mark ; Yue, C. Patrick
Author_Institution
High-Speed Silicon Lab., Univ. of California, Santa Barbara, CA
fYear
2008
fDate
June 17 2008-April 17 2008
Firstpage
369
Lastpage
372
Abstract
This paper presents an LC-tuned, 24-GHz single-pole double-throw (SPDT) transmit/receive (T/R) switch implemented in 90-nm CMOS. The design focuses on the techniques to increase the power handling capability in the transmit (Tx) mode under 1.2-V operation. The switch achieves a measured P-1dB of 28.7 dBm, which represents the highest linearity, reported to date, for CMOS millimeter-wave T/R switches. The transmit and receive (Rx) branches employ different switch topologies to minimize the power leakage into the Rx path during Tx mode, and hence improve the linearity. To accommodate large signal swing, AC floating bias is applied using large bias resistors to all terminals of the switch devices. Triple-well devices are utilized to effectively float the substrate terminals. The switch uses a single 1.2-V digital control signal for T/R mode selection and for source/drain bias. The measured insertion loss is 3.5 dB and return loss is better than -10 dB at 24 GHz.
Keywords
CMOS integrated circuits; RLC circuits; circuit tuning; microwave switches; millimetre wave circuits; AC floating bias; CMOS; frequency 24 GHz; insertion loss; power leakage; return loss; single-pole double-throw transmit-receive switch; substrate terminals; voltage 1.2 V; Digital control; Insertion loss; Linearity; Millimeter wave measurements; Millimeter wave technology; Resistors; Roentgenium; Switches; Topology; Virtual colonoscopy; 1-dB compression point; CMOS transmit/receive (T/R) switch; floating substrate; triple-well;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE
Conference_Location
Atlanta, GA
ISSN
1529-2517
Print_ISBN
978-1-4244-1808-4
Electronic_ISBN
1529-2517
Type
conf
DOI
10.1109/RFIC.2008.4561456
Filename
4561456
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