Title :
Ultrafast carrier dynamics,in ferromagnetic semiconductors
Author :
Wang, J. ; Kono, J. ; Owia, A. ; Munekata, H. ; Stanton, C.J.
Author_Institution :
Departmenl of Electr. & Comput. Eng., Rice Univ., Houston, TX
Abstract :
Two-color, time-resolved reflectivity is used to study femtosecond and picosecond carrier dynamics in III-V ferromagnetic semiconductors. Ultrashort carrier lifetimes, oscillations, and multi-level decay processes were observed. We discuss the dependence of data on the probe wavelength, pump intensity, and sample temperature
Keywords :
III-V semiconductors; carrier lifetime; carrier mobility; ferromagnetic materials; high-speed optical techniques; magnetic semiconductors; reflectivity; III-V ferromagnetic semiconductors; carrier oscillations; femtosecond carrier dynamics; ferromagnetic semiconductors; multilevel decay processes; picosecond carrier dynamics; time-resolved reflectivity; two-color reflectivity; ultrafast carrier dynamics; ultrashort carrier lifetimes;
Conference_Titel :
Quantum Electronics Conference, 2004. (IQEC). International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-778-4
