Title :
A Quarter-Wave Stripline Resonator for the Measurement of the Dielectric Properties of Substrate Materials
Author :
Fischer, Matti ; Vainikainen, Pertti ; Nyfors, Ebbe
Author_Institution :
Helsinki University of Technology, Radio Laboratory, Otakaari 5 A, Espoo 02150, Finland
Abstract :
In this paper a quarter-wave stripline resonator sensor for the measurement of dielectric sheets is presented. The resonant frequency of the sensor depends linearily on the dielectric constant of the sheet. The sensor can be used for example for the measurement of the dielectric properties of substrate materials at 8 GHz with a spatial resolution of about 6 mm and dielectric constant resolution of about 0.2 % for the real part.
Keywords :
Area measurement; Conducting materials; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Resonant frequency; Sheet materials; Spatial resolution; Stripline;
Conference_Titel :
Microwave Conference, 1991. 21st European
Conference_Location :
Stuttgart, Germany
DOI :
10.1109/EUMA.1991.336343
