• DocumentCode
    2082596
  • Title

    A Quarter-Wave Stripline Resonator for the Measurement of the Dielectric Properties of Substrate Materials

  • Author

    Fischer, Matti ; Vainikainen, Pertti ; Nyfors, Ebbe

  • Author_Institution
    Helsinki University of Technology, Radio Laboratory, Otakaari 5 A, Espoo 02150, Finland
  • Volume
    1
  • fYear
    1991
  • fDate
    9-12 Sept. 1991
  • Firstpage
    447
  • Lastpage
    452
  • Abstract
    In this paper a quarter-wave stripline resonator sensor for the measurement of dielectric sheets is presented. The resonant frequency of the sensor depends linearily on the dielectric constant of the sheet. The sensor can be used for example for the measurement of the dielectric properties of substrate materials at 8 GHz with a spatial resolution of about 6 mm and dielectric constant resolution of about 0.2 % for the real part.
  • Keywords
    Area measurement; Conducting materials; Dielectric constant; Dielectric materials; Dielectric measurements; Dielectric substrates; Resonant frequency; Sheet materials; Spatial resolution; Stripline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1991. 21st European
  • Conference_Location
    Stuttgart, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1991.336343
  • Filename
    4136327