Title :
A Phased Array RFIC with Built-In Self-Test Using an Integrated Vector Signal Analyzer
Author :
Inac, Ozgur ; Shin, Donghyup ; Rebeiz, Gabriel M.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of California at San Diego, San Diego, CA, USA
Abstract :
An X-band phased-array RF integrated circuit with built-in self-test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Measurements done with BIST system agree well with S-parameter data and provide the amplitude and phase response over phase states and over frequency. To our knowledge, this is the first implementation of an on-chip BIST and with high accuracy.
Keywords :
built-in self test; integrated circuit testing; microwave integrated circuits; BIST capabilities; BIST system; S-parameter data; X-band phased-array RF integrated circuit; amplitude response; built-in self-test; integrated vector signal analyzer; miniature capacitive coupler; onchip I-Q vector receiver; phase response; phase states; phased array RFIC; Arrays; Built-in self-test; Couplers; Phase measurement; Radio frequency; Receivers; System-on-a-chip;
Conference_Titel :
Compound Semiconductor Integrated Circuit Symposium (CSICS), 2011 IEEE
Conference_Location :
Waikoloa, HI
Print_ISBN :
978-1-61284-711-5
Electronic_ISBN :
1550-8781
DOI :
10.1109/CSICS.2011.6062488
