Title :
Recording of 0.1 micron minimum mark size in a new phase change media
Author :
Miura, H. ; Hayaski, Y. ; Fujita, S. ; Ujiie, Kenji ; Yokomori, K.
Author_Institution :
R&D Group, RICOH Co. Ltd., Yokohama, Japan
Abstract :
Inorder to estimate a minimum size for phase-change marks, marks around 0.1 /spl mu/m were recorded on surface recording discs using a far field optical pickup. The shape and uniformity of these marks investigated. The shapes of phase-change marks were investigated by SEM. On the surface recording disc with AgInSbTe phase-change material, the mark size could be reduced to around O.l /spl mu/m in the tangential direction. The fluctuation in mark shape with scaling down of size was hardly recognized.
Keywords :
indium alloys; optical disc storage; pick-ups; silver alloys; solid-state phase transformations; terbium alloys; tin alloys; 0.1 micron minimum mark size; 0.1 mum; AgInSbTe; AgInSbTe phase-change material; far field optical pickup; fluctuation; mark shape; mark size; mark uniformity; minimum size; new phase change media; optical disc storage; phase-change marks; scaling down; surface recording disc; surface recording discs; tangential direction; DVD; Disk recording; Lenses; Optical recording; Optical surface waves; Protection; Research and development; Scanning electron microscopy; Shape; Structural discs;
Conference_Titel :
Optical Data Storage, 2000. Conference Digest
Conference_Location :
Whisler, BC, Canada
Print_ISBN :
0-7803-5950-X
DOI :
10.1109/ODS.2000.847982
